Quantitative ADF-STEM and STEM-EELS at the atomic level
نویسندگان
چکیده
منابع مشابه
Single atomic layer detection of Ca and defect characterization of Bi-2212 with EELS in HA-ADF STEM.
By forming a small electron probe in a scanning transmission electron microscope equipped with a high-angle annular dark-field (HA-ADF) detector, the Bi-O atomic planes in Bi2Sr2CaCu2O(8+delta) (Bi-2212) can be directly observed with the incoherent Z-contrast imaging technique. Using a combination of electron energy loss spectroscopy (EELS) and HA-ADF imaging, we were able to detect the Ca sign...
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Atomically resolved electron energy-loss spectroscopy experiments are commonplace in modern aberration-corrected transmission electron microscopes. Energy resolution has also been increasing steadily with the continuous improvement of electron monochromators. Electronic excitations however are known to be delocalized due to the long range interaction of the charged accelerated electrons with th...
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Compressive STEM-EELS
The collection of electron energy loss spectra (EELS) via scanning transmission electron microscopy (STEM) generally requires a specimen to withstand a large radiation dose. Moreover, significant drift can occur while the spectra are collected. Recent advances in electron microscopy have shown that a data reduction of up to 90% is possible for HAADF/ABF imaging and TEM video [1, 2, 3]. These ad...
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The development of aberration correctors for the scanning transmission electron microscope has revolutionized the field of electron microscopy and dramatically improved the analytical “toolkit” of materials scientists. In particular, when combined with electron energy loss spectroscopy (EELS), scanning transmission electron microscopy (STEM) makes it possible to detect compositional and spectro...
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ژورنال
عنوان ژورنال: Acta Crystallographica Section A Foundations and Advances
سال: 2014
ISSN: 2053-2733
DOI: 10.1107/s2053273314085490